Following characterization facilities are provided at the PIFC:

1. X-ray Powder Diffractometer: 
Application:

• The D2 PHASER measures high-quality data for applications such as qualitative and quantitative crystalline phase identification, polymorphism investigations, determination of crystallinity, and structure investigations.

2. Contact Angle Meter: 
Application:

• To deteremine contact angle value
• To determine surface free energy of solid sample
• Contact angle hysterisis
• Sliding angle

3. C.T. meter : 
Application:

4. Solar Simulator : 
Application:

• Photovoltaic Cell Performance
• Determining electrical performance of photovoltaic cells
• Comparison of cell characteristics among group of cells or different cell designs
• Repeated measurement of the same cell to study life cycle performance changes

5. UV-VIS Spectrophotometer : 
Application:

• UV-VIS absorbance and Transmission Study

6. Electrochemical quartz crystal microbalance (EQCM) : 
Application:

• Electro-deposition
• Electrochemistry studies
• Chemical and biological sensor studies

7. Surface Profiler : 
Application:

• The XP Stylus Profiler instrument measures roughness, waviness, and height in variety applications.
• It has ability to measure precision step height from 10 angstroms to 100 microns.

8. Electrochemical Impedance Spectrometer workstation : 
Application:

• Impedance Study
• Battery/super capacitor testing
• Thin Film deposition
• Corrosion studies
• ZHIT function / Mott-schottky analysis
• Dynamic Mottschottky Plot / Static Mottschottky Plot

9. Spectrofluorometer (PL) : 
Application:

• Fluoromax -4 measures excitation and emission spectra of various organic and inorganic solutions, thin films and powders. Low temperature measurements under N2 atmosphere (Cryogenic measurements) also can be done.

10. Precision LCR meter : 
Application:

• Power Inductor Characterization
• Precise Ceramic Capacitor Measurements
• Semiconductor C-V Evaluation
• Dielectric Material Properties

11. Atomic Force Microscope (AFM ) : 
Application:

• INNOVA 1B3BE measures the surface topography of pellets and thin films such as metal oxides, Polymers, carbon materials, metal chalcogenides etc.

12. Scanning Electron Microscope (SEM) : 
Application:

• The JEOL JSM-6360, helps morphological study of thin films, powders, pellets of Metals, Metal oxides, polymers, alloys.

13. FT- Raman Spectrometer : 
Application:

• Its gives vibrational information specific to the chemical bonds and symmetry of molecules.
• It provides online library for organic and inorganic materials for data analysis and can be calculated Raman crystallite size and phonon modes.